DocumentCode :
1427114
Title :
Editorial: New EIC Introduction
Author :
Bowyer, Kevin
Volume :
22
Issue :
12
fYear :
2000
Firstpage :
1345
Lastpage :
1346
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2000.895969
Filename :
895969
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1427114
