Title :
Behavioral modeling of the IGBT using the Hammerstein configuration
Author :
Hsu, Jia-Tzer ; Ngo, Khai D T
Author_Institution :
Dept. of Electr. Eng., Florida Univ., Gainesville, FL, USA
fDate :
11/1/1996 12:00:00 AM
Abstract :
The Hammerstein model configuration, which includes a nonlinear static block followed by a linear dynamic block, is applied to model the static and dynamic characteristics of the insulated gate bipolar transistor (IGBT). Using least-squares methods, the parameters in the behavioral model can be extracted from the electrical measurements of physical devices or from the circuit simulations of physics-based models. A single set of extracted parameters has been found to yield satisfactory efficiency and accuracy for the tested hard- and soft-switched converters under prescribed ranges of operating conditions
Keywords :
insulated gate bipolar transistors; least squares approximations; power convertors; semiconductor device models; Hammerstein configuration; IGBT; behavioral modeling; circuit simulations; electrical measurements; extracted parameters; hard-switched converters; insulated gate bipolar transistor; least-squares methods; linear dynamic block; nonlinear static block; physics-based models; soft-switched converters; Character recognition; Circuit simulation; Circuit testing; Electric variables measurement; Insulated gate bipolar transistors; Nonlinear dynamical systems; Parameter extraction; Semiconductor devices; Signal processing; System identification;
Journal_Title :
Power Electronics, IEEE Transactions on