• DocumentCode
    1427368
  • Title

    Loss mechanisms in piezoelectrics: how to measure different losses separately

  • Author

    Uchino, Konji ; Hirose, Seiji

  • Author_Institution
    Int. Center for Actuators & Transducers, Pennsylvania State Univ., University Park, PA, USA
  • Volume
    48
  • Issue
    1
  • fYear
    2001
  • Firstpage
    307
  • Lastpage
    321
  • Abstract
    Losses in piezoelectrics are considered in general to have three different mechanisms: dielectric, mechanical, and piezoelectric losses. This paper deals with the phenomenology of losses first, then how to measure these losses separately in experiments. We found that heat generation at off-resonance is caused mainly by dielectric loss tan /spl delta/´ (i.e., P-E hysteresis loss), not by mechanical loss, and that a significant decrease in mechanical Q/sub m/ with an increase of vibration level was observed in resonant piezoelectric ceramic devices, which is due to an increase in the extensive dielectric loss, not in the extensive mechanical loss. We propose the usage of the antiresonance mode rather than the conventional resonance mode, particularly for high power applications because the mechanical quality factor Q/sub B/ at an antiresonance frequency is larger than Q/sub A/ at a resonance frequency.
  • Keywords
    Q-factor; dielectric loss measurement; dielectric losses; hysteresis; loss measurement; losses; mechanical variables measurement; piezoelectric materials; resonance; P-E hysteresis loss; antiresonance mode; dielectric losses; heat generation; high power applications; loss mechanisms; mechanical losses; mechanical quality factor; offresonance; piezoelectric losses; piezoelectric materials; resonant piezoelectric ceramic devices; vibration level; Ceramics; Dielectric devices; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Hysteresis; Loss measurement; Piezoelectric devices; Resonance; Vibrations;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.896144
  • Filename
    896144