DocumentCode :
1427408
Title :
Penalty-free polarisation compensation of SiO2/Si arrayed waveguide grating wavelength multiplexers using stress release grooves
Author :
Wildermuth, E. ; Nadler, Ch ; Lanker, M. ; Hunziker, W. ; Melchior, H.
Author_Institution :
Inst. of Quantum Electron., Fed. Inst. of Technol., Zurich, Switzerland
Volume :
34
Issue :
17
fYear :
1998
fDate :
8/20/1998 12:00:00 AM
Firstpage :
1661
Lastpage :
1663
Abstract :
A new method for the compensation of polarisation sensitivity of arrayed waveguide grating wavelength multiplexers based on SiO2 is presented. By means of stress release grooves, fabrication induced waveguide birefringence is compensated without performance degradation. Reductions of TE/TM passband shifts from 0.66 nm to <0.05 nm are demonstrated
Keywords :
compensation; diffraction gratings; light polarisation; mechanical birefringence; multiplexing equipment; optical communication equipment; optical waveguide components; silicon; silicon compounds; wavelength division multiplexing; SiO2-Si; SiO2/Si arrayed waveguide grating wavelength multiplexer; TE/TM passband shift; all-optical WDM; birefringence; polarisation compensation; stress release groove;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19981186
Filename :
715278
Link To Document :
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