Numerical Analysis of Sampling Streak Camera for Higher Temporal Resolution Operation

The streak camera is one of the highest temporal resolution measurement devices for luminous phenomena, and the sampling streak camera is its advanced device for image measurements in time domain. In general, the temporal resolution of the sampling streak camera is less than that of the conventional streak camera due to complicated electron motion in the device. For improvement of the sampling streak camera for higher temporal resolution of order of pico-second, understanding of physical phenomena in this device is essential and then numerical analysis play an important role. This paper presents a numerical analysis method of the sampling streak camera based on self-consistent simulation of electrostatic field and relativistic electron beam motion by using particle-in-cell (PIC) method. It is predicted from the numerical simulation that higher temporal resolution operation of the sampling streak camera will cause serious inaccuracy in phase information due to the space charge effects.