Title :
A physically based compact model of partially depleted SOI MOSFETs for analog circuit simulation
Author :
Lee, Mike S L ; Tenbroek, Bernard M. ; Redman-White, William ; Benson, James ; Uren, Michael J.
Author_Institution :
Dept. of Electron. & Comput. Sci., Southampton Univ., UK
fDate :
1/1/2001 12:00:00 AM
Abstract :
In this paper, the Southampton Thermal AnaloGue (STAG) compact model for partially depleted (PD) silicon-on-insulator (SOI) MOSFETs is presented. The model uses a single expression to model the channel current, thereby ensuring continuous transition between all operating regions. Furthermore, care has been taken to ensure that this expression is also infinitely differentiable, resulting in smooth and continuous conductances and capacitances as well as higher order derivatives. Floating-body effects, which are particular to PD SOI and which are of concern to analog circuit designers in this technology, are well modeled. Small geometry effects such as channel length modulation (CLM), drain-induced barrier lowering (DIBL), charge sharing, and high field mobility effects have also been included. Self-heating (SH) effects are much more apparent in SOI devices than in equivalent bulk devices. These have been modeled in a consistent manner, and the implementation in SPICE3f5 gives the user an additional thermal node which allows internal device temperature rises to be monitored and also accommodates the modeling of coupled heating between separate devices. The model has been successfully used to simulate a variety of circuits which commonly cause problems with convergence. Due to its inherent robustness, the model can normally achieve convergence without recourse to the setting of initial nodal voltage estimates
Keywords :
CMOS analogue integrated circuits; MOS analogue integrated circuits; MOSFET; capacitance; circuit simulation; convergence; equivalent circuits; high field effects; semiconductor device models; silicon-on-insulator; thermal analysis; DIBL; SPICE3f5; STAG compact model; Si; Southampton thermal analogue compact model; analog circuit simulation; channel current modeling; channel length modulation; charge sharing; continuous capacitances; continuous conductances; convergence; drain-induced barrier lowering; floating-body effects; high field mobility effects; internal device temperature rises; partially depleted SOI MOSFETs; physically based compact model; self-heating effects; small geometry effects; Analog circuits; Capacitance; Convergence; Coupling circuits; Geometry; Heating; MOSFETs; Monitoring; Silicon on insulator technology; Temperature;
Journal_Title :
Solid-State Circuits, IEEE Journal of