• DocumentCode
    1428187
  • Title

    Finite Element Models of Neuron Electrode Sealing Interfaces

  • Author

    Choi, Charles T M ; You, Shan-Jen

  • Author_Institution
    Dept. of Comput. Sci., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    48
  • Issue
    2
  • fYear
    2012
  • Firstpage
    643
  • Lastpage
    646
  • Abstract
    It is desirable to detect any leakage current when microelectrode is used to stimulate a neuron electrically. This paper proposes a new approach to study the neuron-electrode sealing interface problem. As opposite to the traditional bi-domain FEM that need a two-step process of indirect coupling of two domains with a circuit equation, which involves solving a set of ordinary differential equation, this paper proposed a more elegant approach to study the neuron-electrode sealing interface problem based on a single domain finite element model. The result shows the stimulation electrical potential distribution and the sealing resistance match the published simulation and experimental results.
  • Keywords
    bioelectric phenomena; differential equations; finite element analysis; leakage currents; microelectrodes; neurophysiology; differential equation; electrical potential distribution; leakage current; microelectrode; neuron electrode sealing interface problems; sealing resistance match; single domain finite element model; traditional bidomain FEM; Capacitance; Electrodes; Finite element methods; Integrated circuit modeling; Mathematical model; Neurons; Resistance; Bio-electric problem; finite element model; neuron-electrode interface; sealing resistance;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2011.2175717
  • Filename
    6136612