DocumentCode :
1428187
Title :
Finite Element Models of Neuron Electrode Sealing Interfaces
Author :
Choi, Charles T M ; You, Shan-Jen
Author_Institution :
Dept. of Comput. Sci., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume :
48
Issue :
2
fYear :
2012
Firstpage :
643
Lastpage :
646
Abstract :
It is desirable to detect any leakage current when microelectrode is used to stimulate a neuron electrically. This paper proposes a new approach to study the neuron-electrode sealing interface problem. As opposite to the traditional bi-domain FEM that need a two-step process of indirect coupling of two domains with a circuit equation, which involves solving a set of ordinary differential equation, this paper proposed a more elegant approach to study the neuron-electrode sealing interface problem based on a single domain finite element model. The result shows the stimulation electrical potential distribution and the sealing resistance match the published simulation and experimental results.
Keywords :
bioelectric phenomena; differential equations; finite element analysis; leakage currents; microelectrodes; neurophysiology; differential equation; electrical potential distribution; leakage current; microelectrode; neuron electrode sealing interface problems; sealing resistance match; single domain finite element model; traditional bidomain FEM; Capacitance; Electrodes; Finite element methods; Integrated circuit modeling; Mathematical model; Neurons; Resistance; Bio-electric problem; finite element model; neuron-electrode interface; sealing resistance;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2011.2175717
Filename :
6136612
Link To Document :
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