DocumentCode :
1428254
Title :
Temperature-compensated aluminum nitride lamb wave resonators
Author :
Lin, Chih-Ming ; Yen, Ting-Ta ; Lai, Yun-Ju ; Felmetsger, Valery V. ; Hopcroft, Matthew A. ; Kuypers, Jan H. ; Pisano, Albert P.
Author_Institution :
Dept. of Mech. Eng., Univ. of California, Berkeley, CA, USA
Volume :
57
Issue :
3
fYear :
2010
fDate :
3/1/2010 12:00:00 AM
Firstpage :
524
Lastpage :
532
Abstract :
In this paper, the temperature compensation of AlN Lamb wave resonators using edge-type reflectors is theoretically studied and experimentally demonstrated. By adding a compensating layer of SiO2 with an appropriate thickness, a Lamb wave resonator based on a stack of AlN and SiO2 layers can achieve a zero first-order temperature coefficient of frequency (TCF). Using a composite membrane consisting of 1 ??m AlN and 0.83 ??m SiO2, a Lamb wave resonator operating at 711 MHz exhibits a first-order TCF of -0.31 ppm/??C and a second-order TCF of -22.3 ppb/??C2 at room temperature. The temperature-dependent fractional frequency variation is less than 250 ppm over a wide temperature range from -55??C to 125??C. This temperature-compensated AlN Lamb wave resonator is promising for future applications including thermally stable oscillators, filters, and sensors.
Keywords :
III-V semiconductors; UHF filters; aluminium compounds; composite materials; membranes; semiconductor-insulator boundaries; silicon compounds; surface acoustic wave resonators; wide band gap semiconductors; AlN-SiO2; Lamb wave resonators; compensating layer; composite membrane; edge-type reflectors; first-order temperature coefficient of frequency; frequency 711 MHz; room temperature; temperature -55 degC to 125 degC; temperature 293 K to 298 K; temperature compensation; temperature-dependent fractional frequency variation; Aluminum nitride; Biomembranes; Frequency; Oscillators; Resonator filters; Temperature distribution; Temperature sensors; Thermal sensors;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2010.1443
Filename :
5422491
Link To Document :
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