• DocumentCode
    1428268
  • Title

    The Allan Variance - challenges and opportunities

  • Author

    Stein, Samuel R.

  • Author_Institution
    Symmetricom, Inc., Boulder, CO, USA
  • Volume
    57
  • Issue
    3
  • fYear
    2010
  • fDate
    3/1/2010 12:00:00 AM
  • Firstpage
    540
  • Lastpage
    547
  • Abstract
    The Allan variance has historically been estimated using heterodyne measurement systems, which have low noise and preserve the carrier phase information needed for long-term stability. The single-sideband phase noise has traditionally been estimated using phase detectors that suppress the carrier to achieve even lower noise. The recent development of the direct-digital phase noise measurement technique makes it possible to estimate both statistics accurately and simultaneously from the same time series of the phase. Our comparison of the 3 techniques has revealed several challenges to the accurate estimation of the Allan variance including undesired aliasing, biased estimators, and spurious signal generation. Investigation of these difficulties has led to several opportunities to improve Allan variance estimation, including the ability to estimate the instrumentation noise floor during a measurement and the existence of an optimum measurement bandwidth. In the end, this has led to faster, easier, more reliable, and more accurate measurement methods.
  • Keywords
    electric noise measurement; oscillators; phase noise; time series; Allan variance estimation; biased estimators; direct-digital phase noise measurement; heterodyne measurement systems; instrumentation noise floor; optimum measurement bandwidth; single-sideband phase noise; spurious signal generation; statistics; time series; Detectors; Measurement techniques; Noise measurement; Phase detection; Phase estimation; Phase measurement; Phase noise; Signal generators; Stability; Statistics;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2010.1445
  • Filename
    5422493