Title :
Experimental Verification and Finite Element Analysis of Short-Circuit Electromagnetic Force for Dry-Type Transformer
Author :
Ahn, Hyun-Mo ; Oh, Yeon-Ho ; Kim, Joong-Kyoung ; Song, Jae-Sung ; Hahn, Sung-Chin
Author_Institution :
Electr. Eng. Dept., Dong-A Univ., Busan, South Korea
Abstract :
The short-circuit force induces critical mechanical stress on a transformer. This paper deals with experimental verification and finite element analysis (FEA) for short-circuit force prediction of a 50 kVA dry-type transformer. We modeled high voltage (HV) winding into 20 sections and low voltage (LV) winding into 22 sections as similar as those windings of a model transformer. With this modeling technique, we could calculate electromagnetic forces acting on each section of the windings of a dry-type transformer under short-circuit condition. The magnetic vector potentials, magnetic flux densities, and electromagnetic forces due to short-circuit current are solved by FEA. The electromagnetic forces consisting of radial and axial directions depend both on short-circuit current and leakage flux density. These results were used as input source of sequential finite element method (FEM) to predict the resultant mechanical forces considering the structural characteristics such as stress distributions or deformations of windings, accurately. The obtained resultant mechanical forces in HV winding are compared with those of the experimental ones.
Keywords :
electromagnetic forces; finite element analysis; high-voltage techniques; power transformers; short-circuit currents; dry-type transformer; electromagnetic forces; finite element analysis; high voltage winding; leakage flux density; low voltage winding; magnetic flux densities; magnetic vector potentials; short-circuit current; short-circuit electromagnetic force; short-circuit force prediction; Electromagnetic forces; Finite element methods; Force; Power transformers; Strain; Stress; Windings; Dry-type transformer; resultant mechanical force; sequential finite element analysis; short-circuit force;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2011.2174212