DocumentCode
1428315
Title
Multi-walled microchannels: free-standing porous silicon membranes for use in /spl mu/TAS
Author
Tjerkstra, R. Willem ; Gardeniers, Johannes G E ; Kelly, John J. ; van den Berg, A.
Author_Institution
Debye Res. Inst., Utrecht Univ., Netherlands
Volume
9
Issue
4
fYear
2000
Firstpage
495
Lastpage
501
Abstract
Electrochemically formed porous silicon (PS) can be released from the bulk silicon substrate by underetching at increased current density. Using this technique, two types of channels containing free-standing layers of PS were constructed, which were failed multi-walled microchannels (MW /spl mu/Cs). They can be used in devices like microsieves, microbatteries, and porous electrodes. Two types of MW/spl mu/C were made: the "conventional" version, consisting of two or more coaxially constructed microchannels separated by a suspended PS membrane, and the buried variety, where a PS membrane is suspended halfway in an etched cavity surrounded by silicon nitride walls. The latter is more robust. The pore size of the PS was measured using transmission electron microscopy and field emission gun scanning electron microscopy (FEGSEM) and found to be of the order of 7 nm.
Keywords
current density; elemental semiconductors; etching; micromachining; micromechanical devices; porous semiconductors; scanning electron microscopy; silicon; transmission electron microscopy; /spl mu/TAS; Si; coaxially constructed microchannels; current density; field emission gun scanning electron microscopy; free-standing layers; free-standing porous membranes; microbatteries; microsieves; multi-walled microchannels; pore size; porous electrodes; transmission electron microscopy; underetching; Biomembranes; Coaxial components; Current density; Electrodes; Electron emission; Etching; Microchannel; Scanning electron microscopy; Silicon; Transmission electron microscopy;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/84.896771
Filename
896771
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