DocumentCode :
1428343
Title :
A novel parametric-effect MEMS amplifier
Author :
Raskin, Jean-Pierre ; Brown, Andrew R. ; Khuri-Yakub, Butrus T. ; Rebeiz, Gabriel M.
Author_Institution :
Microelectron. Lab., Univ. Catholique de Louvain, Belgium
Volume :
9
Issue :
4
fYear :
2000
Firstpage :
528
Lastpage :
537
Abstract :
This paper presents the theory and measurements of a mechanical parametric-effect amplifier with a 200-kHz input signal and a 1.84-MHz output signal. The device used is a MEMS time-varying capacitor which is composed of an array of low-stress metallized silicon-nitride diaphragms, and is pumped by a large-signal voltage at 1.64 MHz. This induces a large change in the capacitance, and results in parametric amplification of an input signal at 200 kHz. The parametric amplifier capacitance is 500 pF, resulting in an output impedance of 140 /spl Omega/. A higher impedance can also be achieved with a lower capacitance. To our knowledge, this device is the first-ever MEMS mechanical up-converter parametric-effect amplifier developed with an up-conversion ratio of 9:1. The measurements agree very well with theory, including the effect the series resistance and the and of the MEMS time-varying capacitor. The application areas are in amplifiers which operate at very high temperatures (200/spl deg/C-600/spl deg/C), under high particle bombardment (nuclear applications), in non-semiconductor-based amplification, and in low-noise systems, since parametric amplifiers do not suffer from thermal, shot, or 1/f noise problems.
Keywords :
micromachining; micromechanical devices; parametric amplifiers; time-varying systems; varactors; 1.64 MHz; 1.84 MHz; 200 kHz; 200 to 600 degC; 500 pF; Si/sub 3/N/sub 4/; large-signal voltage; low-noise systems; low-stress metallized diaphragms; mechanical up-converter parametric-effect amplifier; nuclear applications; output impedance; parametric-effect MEMS amplifier; particle bombardment; series resistance; time-varying capacitor; up-conversion ratio; Capacitance; Capacitors; Electrical resistance measurement; Impedance; Low-noise amplifiers; Mechanical variables measurement; Metallization; Micromechanical devices; Temperature; Voltage;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/84.896775
Filename :
896775
Link To Document :
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