DocumentCode :
1428741
Title :
Hierarchical Analog/Mixed-Signal Circuit Optimization Under Process Variations and Tuning
Author :
Yu, Guo ; Li, Peng
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX, USA
Volume :
30
Issue :
2
fYear :
2011
Firstpage :
313
Lastpage :
317
Abstract :
A hierarchical optimization methodology is presented to achieve robust analog/mixed-signal circuit design with consideration of process variations. Hierarchical optimization using building circuit block Pareto models is an efficient approach for optimizing nominal performances of large analog circuits. However, yield-aware system optimization, as dictated by the need for safeguarding chip manufacturability in scaled technologies, is completely nontrivial. Two fundamental difficulties are addressed for achieving such a methodology: yield-aware Pareto performance characterization at the building block level and yield-aware optimization problem formulation at the system level. In addition, postsilicon tuning in complex mixed-signal system designs is investigated and the proposed optimization framework is extended for such systems. The presented methodology is demonstrated by hierarchical optimization of a phased-locked loop consisting of multiple building blocks and self-tuning function blocks.
Keywords :
Pareto optimisation; circuit optimisation; circuit tuning; integrated circuit design; integrated circuit yield; mixed analogue-digital integrated circuits; phase locked loops; analog circuit optimization; building circuit block Pareto models; chip manufacturability; hierarchical optimization; integrated circuit design; mixed-signal circuit optimization; phased-locked loop; post silicon tuning; process variations; self-tuning function blocks; yield-aware system optimization; Bismuth; Charge pumps; Integrated circuit modeling; Jitter; Optimization; Phase locked loops; Tuning; Analog; mixed-signal; optimization; postsilicon tuning; yield;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2010.2071250
Filename :
5689353
Link To Document :
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