Investigation of the Failure Mechanism for an S-Band Pillbox Output Window Applied in High-Average-Power Klystrons

Author

Zhu, Fang ; Zhang, Zhao-Chuan ; Luo, Ji-Run ; Zhang, Yu-Wen

Author_Institution

R&D Center for High Power Microwave Devices, Chinese Acad. of Sci., Beijing, China

Volume

57

Issue

4

fYear

2010

fDate

4/1/2010 12:00:00 AM

Firstpage

946

Lastpage

951

Abstract

On the basis of the results of X-ray photoelectron spectroscopy, theoretical analyses, and numerical simulations, the failure mechanism of an S-band pillbox output window applied in a high-average-power klystron is discussed. The influence of the high-order cylindrical-guide modes on the microwave power loss, the direction of the power flow and the window disk cracking are investigated. The high-order cylindrical-guide TM₁₁ mode existing on the surface of the window ceramic disk may cause the carbon film deposition and excessive radio frequency losses on the disk and lead to the breakdown of the window.

Keywords

X-ray photoelectron spectra; failure analysis; klystrons; S-band pillbox output window; X-ray photoelectron spectroscopy; carbon film deposition; excessive radio frequency losses; failure mechanism; high-average-power klystrons; high-order cylindrical-guide TM₁₁ mode; high-order cylindrical-guide modes; microwave power loss; power flow; window ceramic disk; window disk cracking; Ceramics; Dielectric losses; Electric breakdown; Electromagnetic heating; Failure analysis; Klystrons; Microwave devices; Radio frequency; Surface contamination; Thermal stresses; High-average-power klystron; pillbox output window; thermal breakdown;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/TED.2010.2041874

Filename

5422665