• DocumentCode
    1429088
  • Title

    Breakdown strength of nitrogen at high temperatures

  • Author

    Sharbaugh, A. H. ; Watson, P. K. ; Lee, T. H. ; White, D. R. ; Greenwood, Allan

  • Author_Institution
    General Electric Company, Schenectady, N. Y.
  • Volume
    80
  • Issue
    9
  • fYear
    1961
  • Firstpage
    698
  • Lastpage
    698
  • Abstract
    IN A-C circuit-interrupting devices, the post-arc period immediately after current zero is of paramount importance. This period is characterized by the rapid cooling and deionization of the hot gases between the contacts, which build up the dielectric strength of the gap. Simultaneously, however, the circuit transients resulting from the interruption of the current impose a rapidly increasing voltage across the contact gap. This so-called recovery voltage may break down the gap and re-establish the arc.
  • Keywords
    Conductivity; Electric breakdown; Electric shock; Electron tubes; Nitrogen; Temperature measurement;
  • fLanguage
    English
  • Journal_Title
    Electrical Engineering
  • Publisher
    ieee
  • ISSN
    0095-9197
  • Type

    jour

  • DOI
    10.1109/EE.1961.6433428
  • Filename
    6433428