DocumentCode
1429118
Title
Dependence of power loss on lamination thickness in 3% grain-oriented silicon iron
Author
Sharp, M.R.G. ; Overshott, K.J.
Author_Institution
University of Wales Institute of Science & Technology, Wolfson Centre for the Technology of Soft Magnetic Materials, Department of Electrical Engineering, Cardiff, UK
Volume
120
Issue
11
fYear
1973
fDate
11/1/1973 12:00:00 AM
Firstpage
1451
Lastpage
1453
Abstract
Measurements of total power loss and domain-wall spacing have been made on individual grains in polycrystalline specimens of commercial grain-oriented 3% silicon iron. The specimens, initially 0.330 mm in thickness, were reduced in thickness in stages of 0.050 mm to a minimum of approximately 0.100 mm. Analysis of the results shows an optimum sample thickness of between 0.19 mm and 0.25 mm, below which the anomalous losses rise rapidly.
Keywords
domain walls; iron alloys; laminations; losses; magnetic domains; domain wall spacing; grain oriented silicon iron; lamination thickness; measurements; total power loss;
fLanguage
English
Journal_Title
Electrical Engineers, Proceedings of the Institution of
Publisher
iet
ISSN
0020-3270
Type
jour
DOI
10.1049/piee.1973.0298
Filename
5250881
Link To Document