Title :
Testing systems on a chip
Author :
Chandramouli, R. ; Pateras, Stephen
Author_Institution :
BIST, LogicVision Inc., San Jose, CA, USA
fDate :
11/1/1996 12:00:00 AM
Abstract :
Developments in fault-finding circuits built into ICs which will disclose defects in today´s and tomorrow´s block-based designs are examined
Keywords :
application specific integrated circuits; automatic test software; boundary scan testing; built-in self test; design for testability; fault diagnosis; integrated circuit testing; logic testing; ATE; BIST; automation tools; block-based designs; boundary scan; built into IC; core-based design; custom-designed logic; distributed test; embedded test; fault-finding circuits; hierarchical test; system-on-a-chip devices; testing systems on chip; Automatic testing; Circuit testing; Electronic equipment testing; Integrated circuit testing; Logic arrays; Logic design; Logic testing; Semiconductor device testing; System testing; System-on-a-chip;
Journal_Title :
Spectrum, IEEE
