• DocumentCode
    1430013
  • Title

    Dynamic Model of Giant Magnetostrictive Acceleration Sensors Including Eddy-Current Effects

  • Author

    Yan, R. ; Yang, Q. ; Yang, W. ; Hou, S. ; Yan, W.

  • Author_Institution
    Province-Minist. Joint Key Lab. of Electromagn. Field & Electr. Apparatus Reliability, Hebei Univ. of Technol., Tianjin, China
  • Volume
    20
  • Issue
    3
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    1874
  • Lastpage
    1877
  • Abstract
    Compared with other types of acceleration sensors, the rare-earth giant magnetostrictive acceleration sensors have obvious advantages. In order to analyze performance of the giant magnetostrictive acceleration sensors, this paper presents a magneto-mechanical strongly coupled dynamic model for the giant magnetostrictive acceleration sensors, which includes eddy-current effects. Using the proposed model, the time characteristic of the induced voltage for the acceleration sensors is calculated by finite element method (FED). In order to validate the presented model, an experiment of the relation between the induced voltage and time for the acceleration sensors has been done. A comparison between the calculated results and measured ones has been carried out to examine the validity of the proposed model and the FED implementation. It is found that both of them are qualitatively in an agreement. This indicates that the proposed FED model can reflect dynamic response performance of the giant magnetostrictive acceleration sensors.
  • Keywords
    eddy currents; finite element analysis; giant magnetoresistance; magnetic sensors; dynamic response performance; eddy-current effects; finite element method; giant magnetostrictive acceleration sensors; magneto-mechanical strongly coupled dynamic model; Eddy-current effects; giant magnetostrictive acceleration sensors; magneto-mechanical strongly coupled dynamic model;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2010.2041208
  • Filename
    5422834