• DocumentCode
    1430082
  • Title

    Empirical Modeling of Superconducting Fault Current Limiter Using Support Vector Regression

  • Author

    Seo, In-Yong ; Yim, Seong-Woo ; Kim, Hye-Rim ; Ha, Bok-Nam ; Hyun, Ok-Bae

  • Author_Institution
    Korea Electr. Power Res. Inst., Daejeon, South Korea
  • Volume
    20
  • Issue
    3
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    1254
  • Lastpage
    1258
  • Abstract
    The superconductor-triggered type fault current limiter (STFCL), which was developed by Korea Electric Power Corporation (KEPCO) and LS Industrial Systems (LSIS), is under operation for the verification test at KEPCO´s power testing center. The STFCL is composed of superconductor, fast switch and current limiting resistor. The fault current is suppressed after a half cycle by the method of a line commutation. In this paper, we investigated the empirical modeling of STFCL using principal components and auto-associative support vector regression (PCSVR) for the prediction and fault detection of the STFCL. Signals for the model are currents and voltages acquired from high-temperature superconductor (HTS), driving coil (DC) and current limiting resistor (CLR). After developing the empirical model we analyse the accuracy of the model. The results were compared with that of auto-associative neural networks (AANN). PCSVR showed much better performance in accuracy aspect. Moreover, this model can be used for the prognosis of STFCL system.
  • Keywords
    fault current limiters; high-temperature superconductors; principal component analysis; superconducting coils; auto-associative neural networks; current limiting resistor; driving coil; empirical modeling; fault detection; high-temperature superconductor; principal components and auto-associative support vector regression; superconductor-triggered type fault current limiter; Coated conductors; high-temperature super- conductors; modeling; support vector regression;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2010.2040820
  • Filename
    5422865