DocumentCode :
1430211
Title :
BELM: Bayesian Extreme Learning Machine
Author :
Soria-Olivas, Emilio ; Gómez-Sanchis, Juan ; Martín, José D. ; Vila-Francés, Joan ; Martínez, Marcelino ; Magdalena, José R. ; Serrano, Antonio J.
Author_Institution :
Dept. of Electron. Eng., Univ. of Valencia, Burjassot, Spain
Volume :
22
Issue :
3
fYear :
2011
fDate :
3/1/2011 12:00:00 AM
Firstpage :
505
Lastpage :
509
Abstract :
The theory of extreme learning machine (ELM) has become very popular on the last few years. ELM is a new approach for learning the parameters of the hidden layers of a multilayer neural network (as the multilayer perceptron or the radial basis function neural network). Its main advantage is the lower computational cost, which is especially relevant when dealing with many patterns defined in a high-dimensional space. This brief proposes a Bayesian approach to ELM, which presents some advantages over other approaches: it allows the introduction of a priori knowledge; obtains the confidence intervals (CIs) without the need of applying methods that are computationally intensive, e.g., bootstrap; and presents high generalization capabilities. Bayesian ELM is benchmarked against classical ELM in several artificial and real datasets that are widely used for the evaluation of machine learning algorithms. Achieved results show that the proposed approach produces a competitive accuracy with some additional advantages, namely, automatic production of CIs, reduction of probability of model overfitting, and use of a priori knowledge.
Keywords :
belief networks; learning (artificial intelligence); multilayer perceptrons; radial basis function networks; Bayesian extreme learning machine; confidence interval; multilayer neural network; multilayer perceptron; radial basis function; Artificial neural networks; Bayesian methods; Computational modeling; Machine learning; Mathematical model; Optimization; Training; Bayesian; extreme learning machine; multilayer perceptron; radial basis function; Algorithms; Artificial Intelligence; Bayes Theorem; Computer Simulation; Neural Networks (Computer); Pattern Recognition, Automated;
fLanguage :
English
Journal_Title :
Neural Networks, IEEE Transactions on
Publisher :
ieee
ISSN :
1045-9227
Type :
jour
DOI :
10.1109/TNN.2010.2103956
Filename :
5692833
Link To Document :
بازگشت