Title :
A New Isolation Structure of Pogo Pins for Crosstalk Reduction in a Test Socket
Author :
Sun, Ruey-Bo ; Wen, Chang-Yi ; Wu, Ruey-Beei
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fDate :
4/1/2011 12:00:00 AM
Abstract :
A new isolation structure is integrated in the test socket to reduce the crosstalk between pogo pins with various pin patterns and different signal to ground (S/G) ratios. It comprises inserted vias to shield the signal coupling and two metal planes to connect the inserted vias with the ground pogo pins. The crosstalk between pogo pins with and without the isolation structure is simulated and investigated by 3-D full wave analysis. A systematic design methodology is established to determine various structural parameters. It is found that the optimal pin radius to pitch ratio is about 0.2, thereby achieving crosstalk and reflection both smaller than -20 dB for all considered patterns from dc to 10 GHz. Experimental results are in good agreement with the simulation and both validate the proposed design.
Keywords :
circuit noise; crosstalk; integrated circuit testing; printed circuits; 3D full wave analysis; Isolation Structure; crosstalk reduction; design methodology; frequency 0 GHz to 10 GHz; pogo pins; signal coupling; structural parameters; test socket; vias; Crosstalk; Impedance; Manufacturing; Noise; Pins; Power transmission lines; Sockets; Automated test equipment (ATE); crosstalk noise; pin patterns; pogo pin; return loss; signal integrity; test socket;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2010.2102491