Title :
A semiautomatic method for resistor testing
Author :
Burke, W. P. ; Scott, F. J.
Author_Institution :
International Business Machines Corporation, Federal Systems Division, Owego, N. Y.
fDate :
3/1/1961 12:00:00 AM
Abstract :
This article describes a semiautomatic resistor test method and explains how this method implements the gathering of data necessary for reliability predictions. Also explained are the constructional details of the test system, including the various units and associated hardware.
Keywords :
Delay; Fires; Reliability; Resistors; Switches; Thyratrons;
Journal_Title :
Electrical Engineering
DOI :
10.1109/EE.1961.6433682
