Title :
A voltage comparator for low-frequency noise measurements
Author_Institution :
Stanford University, Stanford, Calif.; Mikros Electroscience, Yakima, Wash.
fDate :
3/1/1961 12:00:00 AM
Abstract :
The voltage comparator described was designed for the purpose of measuring low-frequency noise in transistors. In addition, it can be used to study any noise phenomenon within the 50-to 5,000-cycle spectrum.
Keywords :
Frequency measurement; Logic gates; Noise; Noise measurement; Potentiometers; Transistors; Voltage measurement;
Journal_Title :
Electrical Engineering
DOI :
10.1109/EE.1961.6433686
