• DocumentCode
    1431033
  • Title

    Design and Fabrication of Integrated Chirped Bragg Gratings for On-Chip Dispersion Control

  • Author

    Strain, Michael John ; Sorel, Marc

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. of Glasgow, Glasgow, UK
  • Volume
    46
  • Issue
    5
  • fYear
    2010
  • fDate
    5/1/2010 12:00:00 AM
  • Firstpage
    774
  • Lastpage
    782
  • Abstract
    A full description of the synthesis process for chirped and apodized integrated Bragg gratings is presented. Starting from a target complex reflectivity, the local Bragg and coupling coefficients are extracted and converted into physical grating parameters. Control over both the amplitude and group delay profiles of the devices may be exerted using a tapered sidewall relief grating design. Example devices, exhibiting bandwidths of up to 30 nm and both linear and quadratic group-delay profiles with up to a 13-ps span, are realized and compare well with their relative target functions. A passive measurement technique, employing a fully integrated Michelson interferometer, allows reconstruction of the fabricated gratings´ amplitude and phase characteristics.
  • Keywords
    Bragg gratings; Michelson interferometers; coupled mode analysis; integrated optics; optical design techniques; optical fabrication; apodized integrated Bragg gratings; complex reflectivity; coupling coefficients; integrated Michelson interferometer; integrated chirped Bragg grating; on-chip dispersion control; passive measurement technique; physical grating parameter; quadratic group delay profiles; synthesis process; tapered sidewall relief grating design; Bandwidth; Bragg gratings; Chirp; Fabrication; Fiber gratings; Holography; Optical fiber devices; Optical interferometry; Reflectivity; Strain control; Bragg scattering; gratings; integrated optics; optical interferometry; pulse shaping methods; waveguide filters;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2009.2039116
  • Filename
    5423320