Quartz resonator instabilities under cryogenic conditions

Author

Goryachev, Maxim ; Galliou, Serge ; Abbé, Philippe ; Bourgeois, Pierre-Yves ; Grop, Serge ; Dubois, Benoît

Author_Institution

Time & Freq. Dept., Franche-Comte Electron., Mec., Thermique et Opt.-Sci. et Technol. (FEMTO-ST) Inst., Besancon, France

Volume

59

Issue

1

fYear

2012

fDate

1/1/2012 12:00:00 AM

Firstpage

21

Lastpage

29

Abstract

The phase noise of a quartz crystal resonator working at liquid helium temperatures is studied. Measurement methods and the device environment are explained. The phase noise is measured for different resonance modes, excitation levels, amount of operating time, device orientations in relation to the cryocooler vibration axis, and temperatures. Stability limits of a frequency source based on such devices are evaluated in the present measurement conditions. The sources of phase flicker and white noises are identified. Finally, the results are compared with previous works.

Keywords

cryogenics; crystal resonators; phase noise; white noise; cryocooler vibration axis; cryogenic condition; device environment; excitation level; liquid helium temperature; measurement method; phase flicker; phase noise; quartz crystal resonator; quartz resonator instability; resonance modes; white noise; Cryogenics; Frequency measurement; Noise measurement; Phase noise; Resonant frequency;

fLanguage

English

Journal_Title

Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on

Publisher

ieee

ISSN

0885-3010

Type

jour

DOI

10.1109/TUFFC.2012.2152

Filename

6138723