• DocumentCode
    1431574
  • Title

    Bias Prediction for MEMS Gyroscopes

  • Author

    Kirkko-Jaakkola, Martti ; Collin, Jussi ; Takala, Jarmo

  • Author_Institution
    Dept. of Comput. Syst., Tampere Univ. of Technol., Tampere, Finland
  • Volume
    12
  • Issue
    6
  • fYear
    2012
  • fDate
    6/1/2012 12:00:00 AM
  • Firstpage
    2157
  • Lastpage
    2163
  • Abstract
    MEMS gyroscopes are gaining popularity because of their low manufacturing costs in large quantities. For navigation system engineering, this presents a challenge because of strong nonstationary noise processes, such as 1/f noise, in the output of MEMS gyros. In practice, on-the-fly calibration is often required before the gyroscope data are useful and comparable to more expensive optical gyroscopes. In this paper, we focus on an important part of MEMS gyro processing, i.e., predicting the future bias given calibration data with known (usually zero) input. We derive prediction algorithms based on Kalman filtering and the computation of moving averages, and compare their performance against simple averaging of the calibration data based on both simulations and real measured data. The results show that it is necessary to model fractional noise in order to consistently predict the bias of a modern MEMS gyro, but the complexity of the Kalman filter approach makes other methods, such as the moving averages, appealing.
  • Keywords
    1/f noise; Kalman filters; calibration; gyroscopes; inertial navigation; inertial systems; microsensors; moving average processes; Kalman filter; MEMS gyroscope; bias prediction; fractional noise model; moving average process; navigation system enigneering; nonstationary noise process; on-the-fly calibration; prediction algorithm; Calibration; Gyroscopes; Kalman filters; Micromechanical devices; Noise; Temperature sensors; $1/f$ noise; calibration; gyroscopes; microelectromechanical systems; navigation; stochastic processes;
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2012.2185692
  • Filename
    6138895