• DocumentCode
    143213
  • Title

    Throughput driven check point selection in suspicious timing error prediction based designs

  • Author

    Igarashi, H. ; Youhua Shi ; Yanagisawa, M. ; Togawa, N.

  • Author_Institution
    Waseda Univ., Tokyo, Japan
  • fYear
    2014
  • fDate
    25-28 Feb. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, a throughput-driven design technique is proposed, in which a suspicious timing error prediction circuit is inserted to monitor the signal transitions at some selected check points. Unlike previous works where timing errors are detected after their occurrence, the proposed method tries to use the real intermediate signal transitions for timing error prediction. The check point selection will affect both the maximal operation frequency and the suspicious timing error overestimation rate, both of which have an effect on the overall throughput, thus an analysis on the check point selection is also given. In our work, the circuit can be overclocked by a factor of 2 or more with ignorable area overhead while guarantees the always-correct output.
  • Keywords
    integrated circuit design; suspicious timing error prediction based designs; suspicious timing error prediction circuit; throughput driven check point selection; throughput-driven design technique; timing errors; Clocks; Delays; Latches; Monitoring; Simulation; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (LASCAS), 2014 IEEE 5th Latin American Symposium on
  • Conference_Location
    Santiago
  • Print_ISBN
    978-1-4799-2506-3
  • Type

    conf

  • DOI
    10.1109/LASCAS.2014.6820280
  • Filename
    6820280