DocumentCode
143213
Title
Throughput driven check point selection in suspicious timing error prediction based designs
Author
Igarashi, H. ; Youhua Shi ; Yanagisawa, M. ; Togawa, N.
Author_Institution
Waseda Univ., Tokyo, Japan
fYear
2014
fDate
25-28 Feb. 2014
Firstpage
1
Lastpage
4
Abstract
In this paper, a throughput-driven design technique is proposed, in which a suspicious timing error prediction circuit is inserted to monitor the signal transitions at some selected check points. Unlike previous works where timing errors are detected after their occurrence, the proposed method tries to use the real intermediate signal transitions for timing error prediction. The check point selection will affect both the maximal operation frequency and the suspicious timing error overestimation rate, both of which have an effect on the overall throughput, thus an analysis on the check point selection is also given. In our work, the circuit can be overclocked by a factor of 2 or more with ignorable area overhead while guarantees the always-correct output.
Keywords
integrated circuit design; suspicious timing error prediction based designs; suspicious timing error prediction circuit; throughput driven check point selection; throughput-driven design technique; timing errors; Clocks; Delays; Latches; Monitoring; Simulation; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (LASCAS), 2014 IEEE 5th Latin American Symposium on
Conference_Location
Santiago
Print_ISBN
978-1-4799-2506-3
Type
conf
DOI
10.1109/LASCAS.2014.6820280
Filename
6820280
Link To Document