DocumentCode
1432321
Title
Characterization of bolometers based on polycrystalline silicon germanium alloys
Author
Sedky, S. ; Fiorini, P. ; Caymax, M. ; Baert, C. ; Hermans, L. ; Mertens, R.
Author_Institution
IMEC, Leuven, Belgium
Volume
19
Issue
10
fYear
1998
Firstpage
376
Lastpage
378
Abstract
In this paper, we report on the first realization and characterization of uncooled Infra Red (IR) bolometers, based on polycrystalline alloys of silicon and germanium (poly SiGe). Responsivity, thermal conductance, thermal time constant and noise will be analyzed. It will be shown that poly SiGe provides high thermal insulation. An average detectivity of 10/sup 8/ cm/spl radic/(Hz)/W has been measured. We expect that modifications in the device structure could allow to achieve detectivities of 10/sup 9/ cm /spl radic/(Hz)/W.
Keywords
Ge-Si alloys; bolometers; infrared detectors; semiconductor materials; Si-Ge; detectivity; infrared bolometer; noise; polycrystalline silicon germanium alloy; responsivity; thermal conductance; thermal insulation; thermal time constant; Amorphous semiconductors; Bolometers; Germanium alloys; Germanium silicon alloys; Immune system; Integrated circuit noise; Semiconductor device noise; Silicon alloys; Silicon germanium; Thermal conductivity;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/55.720191
Filename
720191
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