DocumentCode
1432405
Title
Effects of nonradiative recombination on the temperature characteristics of threshold current density in 670 nm GaInAsP-AlGaAs visible lasers
Author
Chong, Te-Ho ; Kishino, Katsumi
Author_Institution
Dept. of Electr. & Electron. Eng., Sophia Univ., Tokyo, Japan
Volume
27
Issue
6
fYear
1991
fDate
6/1/1991 12:00:00 AM
Firstpage
1501
Lastpage
1510
Abstract
The effect of nonradiative recombinations on the temperature characteristics of threshold in 670 nm GaInAsP lasers are investigated with theoretical calculations. Lasers with different Al contents (X Al) and p-type doping carrier concentrations of the AlGaAs cladding layers were fabricated in order to evaluate the threshold current densities (J th) and the temperature characteristics of J th. The dependence of J th on the active layer thickness was also evaluated. By subtracting the calculated pure radiative recombination component of J th from the experimental J th values, the nonradiative recombination current densities were obtained as a function of inverse temperature. The thermal activation energies were evaluated for different ΔE g . It was found that the nonradiative recombinations were governed by the heterobarrier heights. The increase of J th with decreasing X Al was explained theoretically in terms of the carrier leakage over heterobarriers. It is concluded that the carrier leakage components are the main nonradiative recombination processes in these lasers
Keywords
III-V semiconductors; aluminium compounds; current density; gallium arsenide; indium compounds; laser theory; laser transitions; semiconductor junction lasers; 670 nm; AlGaAs cladding layers; GaInAsP-AlGaAs visible lasers; III-V semiconductor; active layer thickness; carrier leakage; heterobarrier heights; inverse temperature; nonradiative recombination; p-type doping carrier concentrations; temperature characteristics; thermal activation energies; threshold current density; Chemical lasers; Gas lasers; Laser modes; Laser theory; Radiative recombination; Semiconductor lasers; Substrates; Surface emitting lasers; Temperature; Threshold current;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.89970
Filename
89970
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