Title :
Improvements in Efficiency of Surface Potential Computation for Independent DG MOSFET
Author :
Abraham, Aby ; Jandhyala, Srivatsava ; Mahapatra, Santanu
Author_Institution :
Dept. of Electron. Syst. Eng., Indian Inst. of Sci., Bangalore, India
fDate :
4/1/2012 12:00:00 AM
Abstract :
A robust numerical solution of the input voltage equations (IVEs) for the independent-double-gate metal-oxide-semiconductor field-effect transistor requires root bracketing methods (RBMs) instead of the commonly used Newton-Raphson (NR) technique due to the presence of nonremovable discontinuity and singularity. In this brief, we do an exhaustive study of the different RBMs available in the literature and propose a single derivative-free RBM that could be applied to both trigonometric and hyperbolic IVEs and offers faster convergence than the earlier proposed hybrid NR-Ridders algorithm. We also propose some adjustments to the solution space for the trigonometric IVE that leads to a further reduction of the computation time. The improvement of computational efficiency is demonstrated to be about 60% for trigonometric IVE and about 15% for hyperbolic IVE, by implementing the proposed algorithm in a commercial circuit simulator through the Verilog-A interface and simulating a variety of circuit blocks such as ring oscillator, ripple adder, and twisted ring counter.
Keywords :
MOSFET; Newton-Raphson method; numerical analysis; IVE; NR-Ridders algorithm; Newton-Raphson technique; Verilog-A interface; commercial circuit simulator; hyperbolic IVE; independent DG MOSFET; independent-double-gate metal-oxide-semiconductor field-effect transistor; input voltage equations; nonremovable discontinuity; nonremovable singularity; ring oscillator; ripple adder; robust numerical solution; root bracketing methods; single derivative-free RBM; surface potential computation efficiency; trigonometric IVE; twisted ring counter; Convergence; Hardware design languages; Integrated circuit modeling; MOSFET circuits; Transistors; Upper bound; Circuit simulation; compact modeling; independent-double-gate metal–oxide–semiconductor field-effect transistor (IDG MOSFET);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2011.2181976