DocumentCode :
1432645
Title :
Feedback-stabilized Nd:YLF amplifier system for generation of picosecond pulse trains of an exactly rectangular envelope
Author :
Will, Ingo ; Liero, Armin ; Mertins, Dieter ; Sandner, Wolfgang
Author_Institution :
Max Born Inst. for Nonlinear Opt. & Short Pulse Spectrosc., Berlin, Germany
Volume :
34
Issue :
10
fYear :
1998
fDate :
10/1/1998 12:00:00 AM
Firstpage :
2020
Lastpage :
2028
Abstract :
We describe the amplifier chain of the photocathode laser of the TESLA Test Facility. This chain is optimized for amplification of trains of picosecond pulses. At its output, pulse trains with a rectangularly shaped envelope of 0.7% flatness and a long-term stability of the energy in the individual picosecond pulses in excess of 0.9% are obtained. This stability is achieved by using a computerized feedback control system, which we describe in detail together with the versatile feedback algorithm applied. The feedback loop performs a tight adjustment of both the shape and magnitude of the flashlamp pulses as well as the starting time of the pump with respect to the pulse train. High-current insulated gate bipolar transistors are used to directly manipulate the flashlamp current in a microsecond time scale
Keywords :
computerised control; flash lamps; high-speed optical techniques; laser feedback; laser stability; lithium compounds; neodymium; optical variables control; photocathodes; physical instrumentation control; solid lasers; yttrium compounds; LiYF4:Nd; TESLA Test Facility; YLF:Nd; amplifier chain; computerized feedback control system; exactly rectangular envelope; feedback algorithm; feedback loop; feedback-stabilized Nd:YLF amplifier system; flashlamp pulses; high-current insulated gate bipolar transistors; long-term stability; microsecond time scale; photocathode laser; picosecond pulse train generation; pump starting time; rectangularly shaped envelope; Cathodes; Feedback control; Feedback loop; Insulated gate bipolar transistors; Laser feedback; Pulse amplifiers; Pulse shaping methods; Shape; Stability; Test facilities;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.720242
Filename :
720242
Link To Document :
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