• DocumentCode
    1433058
  • Title

    Using dynamical embedding to isolate seizure components in the ictal EEG

  • Author

    James, C. ; Lowe, D.

  • Author_Institution
    Neural Comput. Res. Group, Aston Univ., Birmingham, UK
  • Volume
    147
  • Issue
    6
  • fYear
    2000
  • fDate
    11/1/2000 12:00:00 AM
  • Firstpage
    315
  • Lastpage
    320
  • Abstract
    A system for isolating seizure components in the epileptic electroencephalogram (EEG) is presented. The method of independent component analysis (ICA) is implemented to decompose multichannel recordings of scalp EEG known to contain epileptic seizures into their underlying independent components (ICs). The ICs are treated as a convenient expansion basis and in order to identify the relevant seizure components amongst the ICs, a series of dynamical embedding matrices are first constructed along each IC. By observing the change in structure of the singular spectra obtained by performing a singular value decomposition on each consecutive dynamical embedding matrix, it is possible to track changes in the underlying complexity of each IC with time. The change in complexity is linked to the change in entropy that can be calculated from each consecutive singular spectrum. The change in complexity, coupled with the topographical distribution of each IC, allows seizure-related components extracted by the ICA process to be subjectively identified. The method has been applied to four seizure EEC segments, and in each case probable seizure components were identified subjectively. As a proof-of-principle study, the method indicates that ICA coupled with dynamical embedding may be useful as a tool in pre-processing seizure EEG segments
  • Keywords
    electroencephalography; medical signal processing; singular value decomposition; EEG analysis; consecutive dynamical embedding matrix; dynamical embedding; electrodiagnostics; proof-of-principle study; seizure components isolation; signal pre-processing; singular spectra; topographical distribution;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement and Technology, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2344
  • Type

    jour

  • DOI
    10.1049/ip-smt:20000849
  • Filename
    899983