DocumentCode
1433174
Title
Locating bridging faults using dynamically computed stuck-at fault dictionaries
Author
Gong, Yiming ; Chakravarty, Sreejit
Author_Institution
Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
Volume
17
Issue
9
fYear
1998
fDate
9/1/1998 12:00:00 AM
Firstpage
876
Lastpage
887
Abstract
Novel algorithms for locating bridging faults, based on the voting and wired models, in combinational circuits are presented. The algorithm uses small portions of the stuck-at fault dictionary, not the bridge fault dictionary, computed during fault location. This, along with an implicit representation of bridging faults, contributes significantly to the efficiency of the algorithm. Experimental evaluation of the algorithm on ISCAS circuits is presented
Keywords
circuit analysis computing; combinational circuits; failure analysis; fault location; integrated circuit testing; integrated logic circuits; logic testing; bridging faults location; combinational circuits; dynamically computed fault dictionaries; implicit fault representation; stuck-at fault dictionaries; voting model; wired models; Bridge circuits; Circuit faults; Circuit testing; Computer science; Dictionaries; Failure analysis; Fault diagnosis; Fault location; Semiconductor device modeling; Voting;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.720323
Filename
720323
Link To Document