DocumentCode
1434150
Title
Dependence of atomic diffusion in GaAs upon experimental design
Author
Cohen, Richard M.
Author_Institution
Dept. of Mater. Sci. & Eng., Utah Univ., Salt Lake City, UT, USA
Volume
4
Issue
4
fYear
1998
Firstpage
647
Lastpage
652
Abstract
The rate of impurity diffusion in GaAs depends upon the concentration of point defects such as vacancies and interstitials. The concentration of those point defects is strongly affected by the region of the phase diagram corresponding to the chosen experimental design. Different regions of phase diagrams are used to illustrate why nominally similar experiments can lead to dramatically different results. When the equilibrium point defect concentrations can be approached in a time which is short compared to the anneal time, the measured diffusivities tend to be reproducible. However, when the point defect concentrations approach their equilibrium values over times which are long compared to the anneal time, the measured diffusivities tend to be irreproducible and time dependent. Examples of “anomalous” diffusion are discussed and shown to be associated with fundamental differences in experimental design that tend to bring the point defect concentration toward equilibrium in different regions of the phase diagram
Keywords
design of experiments; gallium arsenide; interstitials; phase diagrams; point defects; GaAs; anneal time; atomic diffusion; equilibrium point defect concentrations; impurity diffusion rate; interstitials; measured diffusivities; phase diagram; point defect concentration; point defect concentrations; point defects concentration; time dependent; vacancies; Annealing; Design for experiments; Design for testability; Diffusion processes; Gallium arsenide; Gallium compounds; Semiconductor impurities; Temperature; Thermodynamics; Time measurement;
fLanguage
English
Journal_Title
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
1077-260X
Type
jour
DOI
10.1109/2944.720475
Filename
720475
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