Title :
Accurate EM-Based Modeling of Cascode FETs
Author :
Resca, Davide ; Lonac, Julio A. ; Cignani, Rafael ; Raffo, Antonio ; Santarelli, Alberto ; Vannini, Giorgio ; Filicori, Fabio
Author_Institution :
Microwave Electron. for Commun., MEC s.r.l., Bologna, Italy
fDate :
4/1/2010 12:00:00 AM
Abstract :
Cascode field-effect transistors (FETs) are widely used in the design of monolithic microwave integrated circuits (MMICs), owing to their almost unilateral and broadband behavior. However, since a dedicated model of the cell is rarely provided by foundries, a suboptimal description built by replicating the standard foundry model for both the common source and common gate device is often adopted. This might limit the success of the MMIC design at the first foundry run. This paper describes an electromagnetic-based empirical model of cascode cells, covering topics from the formulation and identification procedures to the corresponding validation described in an exhaustive experimental section. A MMIC low-noise distributed amplifier case is then presented and the proposed model is used for circuit analysis and instability detection. Clear indication is provided about the improvement in the prediction of critical behaviors with respect to conventional modeling approaches. A cascode cell with a symmetric layout is also successfully modeled.
Keywords :
MMIC; amplifiers; field effect transistors; foundries; MMIC design; MMIC low noise distributed amplifier; cascode FET; cascode cells; cascode field effect transistors; circuit analysis; common gate device; common source; electromagnetic based empirical model; monolithic microwave integrated circuits; standard foundry model; Electromagnetic (EM) analysis; microwave field-effect transistors (FETs); monolithic microwave integrated circuits (MMICs); semiconductor device modeling;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2010.2041576