DocumentCode :
1434323
Title :
A reconfigurable wafer-scale memory
Author :
Boubekeur, Ahmed ; Saucier, Gabrièkle ; Trilhe, Jacques
Author_Institution :
Lab. Conception de Syst. Integres, Inst. Nat. Polytech. de Grenoble, France
Volume :
26
Issue :
10
fYear :
1991
fDate :
10/1/1991 12:00:00 AM
Firstpage :
1423
Lastpage :
1432
Abstract :
Describes the design and experimental results of a wafer-scale reconfigurable static memory. To achieve this, elementary memory chips are implemented on a 4-in wafer with a regular layout allowing step-and-repeat manufacturing, and the final memory is constructed with the good chips. After an external test, a cartography of good chips is established. Two algorithms, one based on distance sorting and the other one on a linear scanning of the wafer, have been developed to define an optimized global architecture with the good chips. Hard configuration of these chips is done by laser techniques. The switching technology to discard faulty elements and replace them by spares and the copper tracks to drive a large amount of current on typical 10-cm lines are described
Keywords :
VLSI; integrated memory circuits; memory architecture; cartography; distance sorting; faulty elements; laser techniques; linear scanning; memory chips; optimized global architecture; reconfigurable wafer-scale memory; static memory; step-and-repeat manufacturing; switching technology; CMOS technology; Circuit faults; Decoding; Image storage; Manufacturing; Power system reliability; Random access memory; Sorting; Testing; Very large scale integration;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.90097
Filename :
90097
Link To Document :
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