DocumentCode
1434338
Title
GaAs trickle transistor dynamic logic
Author
Hoe, David H K ; Salama, C. Andre T
Author_Institution
Dept. of Electr. Eng., Toronto Univ., Ont., Canada
Volume
26
Issue
10
fYear
1991
fDate
10/1/1991 12:00:00 AM
Firstpage
1441
Lastpage
1448
Abstract
A GaAs dynamic logic gate is proposed which uses a trickle transistor to compensate for leakage from the precharged node. This trickle transistor dynamic logic (TTDL) circuit is configured as a domino logic gate and a differential cascode voltage switch logic (CVSL) gate. Delay chains were implemented in a 1-μm GaAs enhancement/depletion (E/D) process where the depletion-mode FETs (DFETs) and the enhancement-mode FETs (EFETs) have threshold voltages of -0.6 and 0.15 V, respectively, in order to obtain an experimental characterization of these gates. In addition, the TTDL gates were used to implement a 4-b carry-lookahead adder. The adder has a critical delay of 0.8 ns and a power dissipation of 130 mW
Keywords
III-V semiconductors; adders; field effect integrated circuits; gallium arsenide; integrated logic circuits; logic gates; -0.6 V; 0.15 V; 1 micron; GaAs; TTDL gates; carry-lookahead adder; critical delay; depletion-mode FETs; differential cascode voltage switch logic; domino logic gate; dynamic logic gate; enhancement-mode FETs; enhancement/depletion process; power dissipation; precharged node; threshold voltages; trickle transistor; Adders; Delay; FETs; Gallium arsenide; Logic circuits; Logic gates; Power dissipation; Switches; Switching circuits; Threshold voltage;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.90099
Filename
90099
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