• DocumentCode
    1434351
  • Title

    Fabrication and Properties of High- T_{\\rm c} YBCO Josephson Junction and SQUID With Variable Thickness Bridges by Focused Ion Beam

  • Author

    Wu, Chiu-Hsien ; Jhan, Fong-Jyun ; Chen, Jau-Han ; Jeng, Jen-Tzong ; Chen, Kuen-Lin ; Yang, Hong-Chang

  • Author_Institution
    Inst. of Nanosci., Nat. Chung Hsing Univ., Taichung, Taiwan
  • Volume
    21
  • Issue
    3
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    375
  • Lastpage
    378
  • Abstract
    We have successfully fabricated YBCO Josephson junctions and SQUIDs with variable thickness bridges. The variable-thickness bridges of YBCO thin film were fabricated by photolithography and Focused ion beam mill. The Josephson effects of variable thickness bridges were obtained in a 80 nm-thick-film of high-Tc YBa2Cu3Oy. The Shapiro steps were observed in single junction in the gigahertz range from 3.02 to 14.64 GHz. The voltage-current and voltage-field characteristics were measured in SQUID magnetometer. The SQUID shows a peak-to-peak voltage swing of 1.5 μV at 70 K. The properties of one junction and SQUID magnetometer have been investigated.
  • Keywords
    SQUID magnetometers; barium compounds; focused ion beam technology; high-temperature superconductors; photolithography; superconducting junction devices; superconducting thin films; ytterbium compounds; Josephson effects; SQUID magnetometer; Shapiro steps; YBCO; YBCO thin film; focused ion beam mill; frequency 3.02 GHz to 14.64 GHz; gigahertz range; high-Tc YBCO Josephson junction; peak-to-peak voltage swing; photolithography; single junction; temperature 70 K; variable thickness bridges; voltage 1.5 muV; voltage-current; voltage-field characteristics; Bridge circuits; Josephson junctions; Junctions; Resistance; SQUIDs; Superconducting microwave devices; Yttrium barium copper oxide; Focused ion beam; Josephson junction; variable thickness bridges;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2010.2100352
  • Filename
    5699961