Title :
Radiation testing of semiconductor devices for space electronics
Author :
Pease, Ronald L. ; Johnston, Allan H. ; Azarewicz, Joseph L.
Author_Institution :
Mission Res. Corp., Albuquerque, NM, USA
fDate :
11/1/1988 12:00:00 AM
Abstract :
Radiation effects testing, part selection, and hardness assurance for application to electronic components in the natural space environment are discussed. The emphasis is on semiconductor devices, primarily silicon microcircuits, which are used in the greatest quantity and which, in most cases, are the most sensitive. After a summary of the natural space radiation environment and the effects of radiation on semiconductor devices, laboratory simulation of space radiation and extrapolation to space are covered. Radiation testing is performed to understand failure mechanisms, to characterize the radiation response of specific devices, and to provide data for lot acceptance. Part selection and hardness assurance are discussed by contrasting the traditional approach with the unique aspects of space systems. Some recommendations are made for treating the more complex aspects of space system microcircuit hardness assurance
Keywords :
VLSI; elemental semiconductors; failure analysis; inspection; integrated circuit technology; integrated circuit testing; large scale integration; quality control; radiation hardening (electronics); reliability; silicon; Si microelectronics; failure mechanisms; hardness assurance; laboratory simulation; lot acceptance; natural space radiation environment; part selection; radiation response; radiation testing of semiconductor devices; recommendations; satellite electronics; space electronics; space system microcircuit hardness assurance; unique aspects of space systems; Aerospace electronics; Belts; Electronic components; Electronic equipment testing; Extrapolation; Failure analysis; Radiation effects; Semiconductor device testing; Semiconductor devices; Space missions;
Journal_Title :
Proceedings of the IEEE
