Title :
Capturing skin effect with an effective nonuniform mesh and coupled R-L circuits
Author :
Song, Zhanfeng ; Yahyaoui, W. ; Duval, Fabrice ; Su, Donglin ; Louis, Anne
Author_Institution :
EMC Lab., Beihang Univ. (BUAA), Beijing, China
fDate :
1/1/2011 12:00:00 AM
Abstract :
The frequency dependent inductances and resistances due to skin effect result in inaccurate solutions for electrical interconnect and package design and electromagnetic compatibility modelling. A novel nonuniform mesh approach for rectangular conductors and the calculation of resultant skin effect equivalent circuit elements are proposed. With this procedure, skin effect is effectively characterised by a parallel coupled R-L circuit network with a few elements.
Keywords :
coupled circuits; electromagnetic compatibility; equivalent circuits; inductance; skin effect; electrical interconnect; electromagnetic compatibility modelling; frequency dependent inductance; nonuniform mesh; package design; parallel coupled R-L circuit network; rectangular conductor; resistance; resultant skin effect equivalent circuit element; skin effect;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2010.7754