Title :
Effect of surface roughness on surface resistance of plane copper surfaces at millimetre waves
Author_Institution :
North Carolina State University, Electromagnetics Laboratory, Raleigh, USA
fDate :
5/1/1974 12:00:00 AM
Abstract :
Measurements have been made at 35 GHz of the increase of surface resistance of plane copper surfaces caused by surface roughness. The side walls of an H-guide cavity were ground one-directionally with abrasive papers of various grades. Surface roughness was determined mechanically, optically, and by microphotography. Q factors of the cavity were measured and evaluated and compared for various degrees of surface roughness
Keywords :
Q-factor measurement; cavity resonators; microwave measurement; resistance measurement; surface contours; Q-factor measurement; cavity resonators; microwave measurement; millimetre waves; plane copper surfaces; resistance measurement; surface contours; surface resistance; surface roughness;
Journal_Title :
Electrical Engineers, Proceedings of the Institution of
DOI :
10.1049/piee.1974.0065
