Title :
Comments on `The measurement of the properties of materials´ by M.N. Afsar et al
Author_Institution :
VNIIFTRI Goststandard, Moscow, USSR
fDate :
11/1/1988 12:00:00 AM
Abstract :
It is pointed out that the references cited in a previous paper (ibid., vol.75, no.1 p.183-99, 1986) do not support the argument that the optimum thickness of the sample should be an integral number of half-wavelengths thick
Keywords :
microwave measurement; permittivity measurement; optimum thickness; Dielectric materials; Dielectric measurements; Frequency; Microwave measurements; Permittivity measurement; Tellurium; Thickness measurement; Uncertainty;
Journal_Title :
Proceedings of the IEEE
