DocumentCode
1434733
Title
Comments on `The measurement of the properties of materials´ by M.N. Afsar et al
Author
Zalt´sman, E.B.
Author_Institution
VNIIFTRI Goststandard, Moscow, USSR
Volume
76
Issue
11
fYear
1988
fDate
11/1/1988 12:00:00 AM
Firstpage
1540
Abstract
It is pointed out that the references cited in a previous paper (ibid., vol.75, no.1 p.183-99, 1986) do not support the argument that the optimum thickness of the sample should be an integral number of half-wavelengths thick
Keywords
microwave measurement; permittivity measurement; optimum thickness; Dielectric materials; Dielectric measurements; Frequency; Microwave measurements; Permittivity measurement; Tellurium; Thickness measurement; Uncertainty;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/5.90118
Filename
90118
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