• DocumentCode
    1434982
  • Title

    Breakdown phenomena in ultra-fast plasma closing switches

  • Author

    Dick, Andrew R. ; MacGregor, Scott J. ; Buttram, M.T. ; Pate, R.C. ; Rinehart, L.F. ; Prestwich, K.R.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Strathclyde Univ., Glasgow, UK
  • Volume
    28
  • Issue
    5
  • fYear
    2000
  • fDate
    10/1/2000 12:00:00 AM
  • Firstpage
    1456
  • Lastpage
    1462
  • Abstract
    An experimental investigation into the rate of voltage collapse in plasma closing switches has been undertaken. A transmission line test switch, incorporating a radial/conical topology to minimize wave reflections, has been used for this investigation. The results described were obtained from experiments using hydrogen, helium, nitrogen, and SF 6. The results show that there is a distinct change in breakdown behavior as the pressure increases. At the lowest tested pressures, there is a rapid voltage collapse phase. This phase reduces at intermediate pressures before recovering at higher pressures. This transition from low-pressure behavior to high-pressure behavior occurred in all the tested gases, although the transition pressure values were dependent on the gas type
  • Keywords
    electric breakdown; helium; hydrogen; nitrogen; plasma pressure; plasma switches; pulse generators; pulsed power switches; sulphur compounds; topology; H2; He; N2; SF6; breakdown behavior; breakdown phenomena; gas type; high-pressure behavior; intermediate pressures; low-pressure behavior; lowest tested pressures; plasma closing switches; pressure; radial/conical topology; rapid voltage collapse phase; tested gases; transition; transition pressure values; transmission line test switch; ultra-fast plasma closing switches; voltage collapse; wave reflections; Electric breakdown; Helium; Hydrogen; Plasma waves; Reflection; Switches; Testing; Topology; Transmission lines; Voltage;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.901214
  • Filename
    901214