DocumentCode
1434983
Title
Stability and numerical dispersion of symplectic fourth-order time-domain schemes for optical field simulation
Author
Hirono, Takuo ; Lui, W.W. ; Yokoyama, K. ; Seki, S.
Author_Institution
NTT Opto-Electron. Labs., Kanagawa, Japan
Volume
16
Issue
10
fYear
1998
fDate
10/1/1998 12:00:00 AM
Firstpage
1915
Lastpage
1920
Abstract
The use of a more accurate scheme is effective in reducing the required memory resources in the explicit time-domain simulation of optical field propagation. A promising technique is the application of the symplectic integrator, which can simulate the long-term evolution of a Hamiltonian system accurately. The stability condition and the numerical dispersion of schemes with fourth-order accuracy in time and space using the symplectic integrator are derived for the transverse electric (TE)-mode in two dimensions. Their stable and accurate performance is qualitatively verified, and is also demonstrated by numerical simulations of wave-converging by a perfect electric conductor wall and propagation along a waveguide whose refractive index difference between the core and cladding is more than 9%
Keywords
electromagnetic field theory; electromagnetic wave propagation; finite difference time-domain analysis; optical waveguide theory; refractive index; stability; Hamiltonian system; TE-mode; cladding; core; explicit time-domain simulation; fourth-order accuracy; long-term evolution; memory resources; numerical dispersion; optical field propagation; optical field simulation; optical waveguide theory; perfect electric conductor wall; refractive index difference; stability; stability condition; stable accurate performance; symplectic fourth-order time-domain schemes; symplectic integrator; Electromagnetic waveguides; Finite difference methods; Numerical stability; Optical propagation; Optical refraction; Optical variables control; Optical waveguide theory; Optical waveguides; Permittivity; Time domain analysis;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/50.721080
Filename
721080
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