Title :
Reduction of electric-field intensification and hot-spot formation inside cable terminations
Author :
Metwally, I.A. ; Al-Badi, A. ; Al-Hinai, Aysha ; Al-Mayasi, M. ; Al-Harthi, A. ; Al-Hashmi, K. ; Al-Zaabi, I.
Author_Institution :
Dept. of Electr. & Comput. Eng., Sultan Qaboos Univ., Muscat, Oman
Abstract :
This paper presents a 2d finite-element analysis for a 33-kV, three-phase, three-core cross-linked polyethylene (XLPE) power cable termination. To enhance the cable termination lifetime, many factors are examined to reduce the electric-field intensification and the induced current density in the copper sheath. The aim of this simulation is to investigate how the electric and the induced current density distributions can be reduced to avoid partial discharge activities and hot spot formation, respectively. In the electrostatic analysis, the electric-field distributions are studied for unpolluted and polluted cases and with different relative permittivities of each layer. In addition, two methods of stress relief are also investigated, namely, the stress control cone and stress control tube. In the magnetic analysis, three cases are investigated at the rated ampacity of the cable, namely, balanced, unbalanced and single phasing, where the induced current density distributions are laterally computed.
Keywords :
XLPE insulation; current density; electric connectors; electric fields; power cable insulation; 2D finite-element analysis; XLPE power cable termination; electric-field distributions; electric-field intensification reduction; electrostatic analysis; hot spot formation; hot-spot formation; induced current density distributions; partial discharge activity avoidance; stress control cone; stress control tube; three-phase three-core cross-linked polyethylene power cable termination; Copper; Electric fields; Permittivity; Power cables; Rubber; Stress; Stress control; Cable termination; electric field distribution; finite element method; hot spot; temperature rise;
Conference_Titel :
Mediterranean Electrotechnical Conference (MELECON), 2014 17th IEEE
Conference_Location :
Beirut
DOI :
10.1109/MELCON.2014.6820530