Title :
Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies
Author :
Ghodgaonkar, D.K. ; Varadan, V.V. ; Varadan, V.K.
Author_Institution :
Pennsylvania State Univ., University Park, PA, USA
fDate :
4/1/1990 12:00:00 AM
Abstract :
A free-space measurement system operating in the 8.2-40-GHz frequency range is used to measure the reflection and transmission coefficients, S11 and S21, of planar samples. The complex electric permittivity and the magnetic permeability are calculated from the measured values of S11 and S21. The measurement system consists of transmit and receive horn lens antennas, a network analyzer, mode transitions, and a computer. Diffraction effects at the edges of the sample are minimized by using spot-focusing lens antennas. Errors due to multiple reflections between antennas via the surface of the sample are corrected by using a free-space TRL (thru, reflect, line) calibration technique. For thin, flexible samples, the sample had to be sandwiched between two half-wavelength (at mid-band) quartz plates to eliminate sagging. Results are reported in the frequency range of 8.6-13.4 GHz for materials such as Teflon, sodium borosilicate glass, and microwave-absorbing materials
Keywords :
computerised instrumentation; magnetic permeability; magnetic variables measurement; microwave measurement; network analysers; permittivity measurement; 8.2 to 40 GHz; Na-B2O3-SiO2; Teflon; calibration; complex permeability; complex permittivity; computer; diffraction effects; free-space measurement; horn lens antennas; magnetic materials; microwave frequencies; microwave-absorbing materials; mode transitions; multiple reflections; network analyzer; planar samples; reflection coefficients; spot-focusing lens antennas; transmission coefficients; Antenna measurements; Electric variables measurement; Frequency measurement; Horn antennas; Lenses; Permeability measurement; Permittivity measurement; Receiving antennas; Reflection; Transmitting antennas;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on