Title :
Measurement of PLL phase error caused by power supply noise
Author :
Jenkins, K.A. ; Eckhardt, J.P.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
10/1/1998 12:00:00 AM
Abstract :
The measurement of the accumulated phase error of phase-locked loops (PLLs) in microprocessor systems is discussed. A system which creates controlled power supply noise and measures the PLL response is described. Examples of the use of this technique are shown for a PLL used in a 400 MHz microprocessor
Keywords :
circuit noise; circuit testing; errors; microcomputers; noise generators; phase locked loops; phase measurement; 400 MHz; PLL phase error; PLL response measurement; accumulated phase error measurement; microprocessor systems; power supply noise;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19981334
