• DocumentCode
    1435936
  • Title

    Some aspects of effects of longitudinal and normal stress on power loss and flux distribution within a transformer core

  • Author

    Joslin, P.C. ; Moses, A.J. ; Thompson, J.E.

  • Author_Institution
    University of Wales Institute of Science & Technology, Wolfson Centre for Soft Magnetic Materials, Cardiff, UK
  • Volume
    119
  • Issue
    6
  • fYear
    1972
  • fDate
    6/1/1972 12:00:00 AM
  • Firstpage
    709
  • Lastpage
    716
  • Abstract
    An experimental 1.0 m Epstein square has been constructed in which all the limbs could be flattened to 1.5×105 N/m2 and two opposite limbs could be stressed longitudinally to ±13.8×106 N/m2 Power-loss measurements were made on cores of 46-grade and 56-grade grain-oriented silicon-iron subjected to combinations of longitudinal and normal stress. The power loss (at 1.5 T) increased by only about 10% owing to the normal compression, but linear stress increased the loss by up to 40% (at 9.65×106 N/m2 compression). When the applied linear stress was greater than about 5.8 × 106 N/m2, the normal stress restricted the power-loss increase. The effect of normal stress on a 45° mitred-overlap and a double-overlap joint were investigated. In the double-overlap joint, the flux did not deviate from the rolling direction of the laminations. Airgaps in the mitred-overlap joint and the length of the overlap were both found to have a pronounced effect on the corner loss. The lower-loss-grade material was found to have a lower stress sensitivity of power loss to both normal and longitudinal stress.
  • Keywords
    alloys; losses; magnetic cores; magnetic properties of substances; transformer magnetic circuits; alloys; flux distribution; grain oriented silicon steel laminations; losses; low power loss; magnetic cores; magnetic properties; magnetostriction; stress; transformer magnetic circuit;
  • fLanguage
    English
  • Journal_Title
    Electrical Engineers, Proceedings of the Institution of
  • Publisher
    iet
  • ISSN
    0020-3270
  • Type

    jour

  • DOI
    10.1049/piee.1972.0149
  • Filename
    5252048