DocumentCode :
1435944
Title :
Noise Analysis of Time Variant Shapers in Frequency Domain
Author :
Gascón, David ; Bota, Sebastià ; Diéguez, Angel ; Garrido, Lluis ; Picatoste, Eduardo
Author_Institution :
Dept. of ECM & the ICC, Univ. of Barcelona, Barcelona, Spain
Volume :
58
Issue :
1
fYear :
2011
Firstpage :
177
Lastpage :
186
Abstract :
In this paper we discuss the noise analysis of time variant shapers in the frequency domain, based on well established concepts of the theory of time varying circuits. A frequency domain extension of the techniques typically adopted for noise analysis in detector instrumentation is proposed and applied to a classic time variant shaper: the gated integrator. In some cases, this frequency domain method makes easier the study of systems in which one of the blocks or noise sources is better described in the frequency domain. In that sense, a practical case involving a gated integrator and a Correlated Double Sampler (CDS) time variant shaper is presented.
Keywords :
frequency-domain analysis; integrated circuit noise; integrating circuits; nuclear electronics; nuclear instrumentation; radiation detection; CDS time variant shaper; Correlated Double Sampler; detector instrumentation; frequency domain method; gated integrator; noise analysis; time varying circuits; $1/f$ noise; correlated double sampler (CDS); gated integrator; low noise electronics; time variant shapers; time varying circuits;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2010.2101082
Filename :
5701789
Link To Document :
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