DocumentCode
1435988
Title
Applicability of ray-tracing technique for the prediction of outdoor channel characteristics
Author
Li, Hsueh-Jyh ; Chen, Cheng-Chung ; Liu, Ta-Yung ; Lin, Han-Chang
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume
49
Issue
6
fYear
2000
fDate
11/1/2000 12:00:00 AM
Firstpage
2336
Lastpage
2349
Abstract
When the ray-tracing technique is employed to calculate outdoor channel characteristics, the input parameters, such as the geometrical layout of streets, buildings, and surroundings, are usually much simplified. In this paper, whether the ray-tracing technique with simplified input parameters can be applied to predict outdoor channel properties is examined and discussed. The delay profiles, the average propagation losses, and the root mean square delay spreads obtained by simulations and by wide-band measurements are compared and analyzed. It is found that the respective delay profiles can be very different. This indicates that the scattering mechanisms in the real environment are different from those considered in simulations. However, the respective average propagation losses and root mean square delay spread can match very well. Nevertheless, the neglect of the distant buildings and incorrect input of the layout geometry can result in a large difference in the calculated statistical parameters
Keywords
delays; electromagnetic wave scattering; radiowave propagation; ray tracing; statistical analysis; LOS path; RMS delay spreads; average propagation losses; buildings; delay profiles; electromagnetic wave propagation; geometrical layout; input parameters; layout geometry; line of sight; line of sight obstructed path; outdoor channel characteristics prediction; radio channel; radiowave propagation; ray-tracing technique; root mean square delay spreads; scattering mechanisms; simulations; statistical parameters; streets; surroundings; wide-band measurements; Electromagnetic scattering; Fading; Geometry; Light scattering; Propagation delay; Pulse measurements; Ray tracing; Root mean square; Solid modeling; Wideband;
fLanguage
English
Journal_Title
Vehicular Technology, IEEE Transactions on
Publisher
ieee
ISSN
0018-9545
Type
jour
DOI
10.1109/25.901902
Filename
901902
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