• DocumentCode
    1435988
  • Title

    Applicability of ray-tracing technique for the prediction of outdoor channel characteristics

  • Author

    Li, Hsueh-Jyh ; Chen, Cheng-Chung ; Liu, Ta-Yung ; Lin, Han-Chang

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    49
  • Issue
    6
  • fYear
    2000
  • fDate
    11/1/2000 12:00:00 AM
  • Firstpage
    2336
  • Lastpage
    2349
  • Abstract
    When the ray-tracing technique is employed to calculate outdoor channel characteristics, the input parameters, such as the geometrical layout of streets, buildings, and surroundings, are usually much simplified. In this paper, whether the ray-tracing technique with simplified input parameters can be applied to predict outdoor channel properties is examined and discussed. The delay profiles, the average propagation losses, and the root mean square delay spreads obtained by simulations and by wide-band measurements are compared and analyzed. It is found that the respective delay profiles can be very different. This indicates that the scattering mechanisms in the real environment are different from those considered in simulations. However, the respective average propagation losses and root mean square delay spread can match very well. Nevertheless, the neglect of the distant buildings and incorrect input of the layout geometry can result in a large difference in the calculated statistical parameters
  • Keywords
    delays; electromagnetic wave scattering; radiowave propagation; ray tracing; statistical analysis; LOS path; RMS delay spreads; average propagation losses; buildings; delay profiles; electromagnetic wave propagation; geometrical layout; input parameters; layout geometry; line of sight; line of sight obstructed path; outdoor channel characteristics prediction; radio channel; radiowave propagation; ray-tracing technique; root mean square delay spreads; scattering mechanisms; simulations; statistical parameters; streets; surroundings; wide-band measurements; Electromagnetic scattering; Fading; Geometry; Light scattering; Propagation delay; Pulse measurements; Ray tracing; Root mean square; Solid modeling; Wideband;
  • fLanguage
    English
  • Journal_Title
    Vehicular Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9545
  • Type

    jour

  • DOI
    10.1109/25.901902
  • Filename
    901902